Stock Markets June 30, 2026 11:38 AM

Keysight Shares Climb After Launch of Integrated GaN MMIC Design Workflow

New workflow with WIN Semiconductors links on-chip simulation, 3D layout verification and off-chip evaluation to reduce tapeout risk for GaN RF designs

By Jordan Park
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Keysight Technologies announced a joint gallium nitride (GaN) monolithic microwave integrated circuit (MMIC) design workflow with WIN Semiconductors, a move that coincided with a roughly 3% rise in the stock. The integrated environment connects multi-domain on-chip simulation, 3D layout verification and off-chip MMIC evaluation board design to help designers achieve first-pass tapeout success for RF applications including 5G base stations, Wi-Fi, satellite payloads and defense radar.

Keysight Shares Climb After Launch of Integrated GaN MMIC Design Workflow
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Key Points

  • Keysight and WIN Semiconductors introduced an integrated GaN MMIC design workflow that ties on-chip multi-domain simulation, 3D layout verification and off-chip evaluation board design into a single environment.
  • The workflow automates simulation, optimization and verification steps within Keysight ADS and RF Circuit Simulation Professional together with WIN’s NP 120P GaN PDK to support first-pass MMIC tapeout.
  • Target applications include 5G base stations, Wi-Fi access points, satellite payloads and defense radar systems, within a global GaN RF device market projected to reach $2.77 billion by 2031.

Shares of Keysight Technologies Inc climbed roughly 3% on Tuesday after the company unveiled a collaborative GaN MMIC design workflow developed with WIN Semiconductors Corp. The joint solution is intended to bring on-chip multi-domain simulation, 3D layout with verification and off-chip MMIC evaluation board design into a single design environment.

The workflow is built to streamline the steps designers typically perform before sending an MMIC design to the foundry. By automating simulation, optimization and verification tasks required for sign-off, the companies said the workflow aims to increase the probability of achieving a first-pass tapeout.

According to the partners, a failed tapeout can impose weeks of delay while a design is respun at a different foundry, underscoring the time costs associated with fabrication setbacks. The new environment allows engineers to design and optimize on-chip and off-chip components together and to validate performance against specifications using test equipment.

The solution is positioned for developers of GaN MMICs across several RF markets. Examples cited by the companies include 5G base station infrastructure, Wi-Fi access point equipment, satellite payload subsystems, and defense radar systems.

WIN Semiconductors’ NP 120P GaN Process Design Kit gives MMIC designers access to process models and layout rules. Those models are integrated within Keysight’s Advanced Design System (ADS) and RF Circuit Simulation Professional products to automate portions of the workflow that support first-pass MMIC tapeout objectives.

"We are delighted to collaborate with Keysight to deliver a customized LVS solution within the WIN ADS PDK," said Richard Kuo, Director of Design Service at WIN Semiconductors. "By combining Keysight’s ADS expertise with WIN’s robust PDK and advanced process technology, we provided a comprehensive verification solution that streamlined the customer’s design flow and accelerated the time-to-market for advanced RF products with greater confidence and reliability."

The companies highlighted the commercial backdrop for GaN RF devices, noting a projected global market size of $2.77 billion by 2031. In practical terms, the workflow is intended to reduce iteration between design and fab, align simulated performance with measured outcomes, and shorten development timelines for advanced RF modules.


Sectors impacted: semiconductor design and fabrication, telecommunications equipment, aerospace and defense electronics.

Risks

  • A failed MMIC tapeout can lead to weeks of delay for a respin at another foundry, disrupting development schedules and time-to-market - impacts sectors relying on rapid RF component deployment such as telecom and defense.
  • Design verification and performance validation still require test equipment to confirm specifications; mismatches between simulated and measured performance could necessitate additional design iterations, affecting semiconductor and systems integrators' timelines.

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